The thermal behavior of the crosslinked Ti-modified polyvinylsilazane precursor was studied up to 1500 oC and shown in TGA curve (Fig. 3). The PVS-Ti(b)-300 sample shows no loss up to 300 oC and a continuous mass loss of 20.65% up to 750 oC. The cessation of mass loss after 750 oC indicated that the polymer to ceramic transformation is complete at this temperature, with the mass loss over the 300 oC - 750 oC temperature range attributed to the evaporation of H2, carbon in the form of CH4, and other hydrocarbons (CnHm) during the decomposition of the polymer precursor.[39]
A further small mass loss of ~1% in the temperature range of 1100 oC – 1500 oC was seen, which may be due to the loss of hydrogen or excess oxygen attached to, the Ti precursor. The total ceramic yield of the sample was found to be 78.2 wt%, which is in good agreement with the theoretical yield (71 .1 wt%, where yield of pure PVS was considered as 83 wt%) of the selected composition for Ti-doped PVS in this work. The DSC thermogram of the sample (Fig. 3) shows a slow and constant rise of the curve up to 745 oC, which is due to the continuous transformation of the sample from polymeric to glassy state. Additionally, an exothermic peak at around 1328 oC as well as an endothermic peak at 1445 oC appeared, which may be due to the development of new phases and their crystallization within the SiCN matrix.
Fig. 4a shows SEM micrograph illustrating the morphology of the ceramics obtained from pyrolysis of the crosslinked powders at 1400°C for 2 hours. Though the SEM micrographs do not show any nanostructural features within the ceramics, the superior thermal stability of the SiTiCNO ceramics can be observed with glassy morphological appearance even at 1400°C. Further, the EDS map images shown in Fig. 4 (b-f) of the PVS-Ti(b)-1400 sample indicate the presence of Si, Ti, C, N, and O elements in the ceramic structure. The pyrolyzed SiTiCNO ceramics consists predominantly of Si, O, C, N, and the Ti distribution appears uniform throughout the ceramic microstructure.
The different phases evolved during different stages of pyrolysis were identified by analyzing XRD patterns of PVS-Ti samples of different thermal history (powders pyrolyzed in the temperature range of 900 oC to 1400 oC, cf. Fig. 5).
The PVS-Ti(b)-900, PVS-Ti(b)-1000, and PVS-Ti(b)-1100 samples were found to be completely amorphous and monophasic. The broad hump ranging from 2Ɵ = 17o to 28o shows Si-O based bonds present in the SiCN structure. This occurs due to the substitution reaction between Si-H site of PVS precursor and Ti-O of tetrabutyl orthotitanate, which forms Si-O-Ti bond. Also, the hump may be of Si–O based bonds occurred due to oxygen adsorbed from the atmosphere due to the high affinity of silicon for oxygen.[40, 41] Therefore, the hump remains present in all pyrolyzed samples and indicates their amorphous nature. Further heating of PVS-Ti(b)-300 sample caused generation of few broad hazy peaks (cf. Fig. 5) at Bragg angles 25.2o, 37.8, 48o, 53.9o, 55.1o, and 62.7o, which corresponds to the (101), (004), (200), (105), (211), and (204) planes of anatase-TiO2, respectively (JCPDS file no. 21-1272). The formation of anatase nanocrystals is due to the structural modification of Si-O-Ti bonds into Si-O and Ti-O resulting in the nucleation and phase separation of TiO2 crystallites in the SiTiCNO matrix. Further, a fraction of these anatase-TiO2 transformed into rutile TiO2 (JCPDS file No. 77-0441) at 1300 oC, which is confirmed by the presence of diffraction peaks at 27.4o, 36o, 41.1o, 54.2o, 56.5o, 62.6o, and 68.8o corresponding to diffraction plane of (110), (101), (111), (211), (220), and (221), respectively (Fig. 5). Interestingly, the formation of a new phase TiC0.3N0.7 (JCPDS file no. 42-1488) was observed in addition to that of TiO2 within the ceramic for samples pyrolyzed at 1400 oC. This phase is generally formed due to the reaction of TiO2 with amorphous SiCN ceramics (Eq. 1).[42]

The diffraction peaks of TiC0.3N0.7 phase (at 36.5o, 42.3o and 61.4o degree corresponding to (111), (200), (220) planes, respectively) indicate a substantial presence of the phase for the PVS-Ti(b)-1400 sample. Additionally for the 1400 oC pyrolyzed samples, the formation of TiC (JCPDS file no. 73-0472) was observed, which could be confirmed from the diffraction peaks at 35.9 o, 41.7 o and 60.4 o corresponding to (111), (200), (220) planes, respectively. The TiC phase could be formed due to the reaction of TiO2 and Cfree phases (Eq. 2).[43]

Thus, the PVS-Ti(b)-1400 sample was essentially found to be consisting of multiple phases including, rutile-TiO2, TiC, TiC0.3N0.7, and the nanodomains of SiO2 in the ceramic.
The XRD-patterns were fitted using Gaussian function after background subtraction and peak widths (full width at half maximum, FWHM) were calculated. The crystallite size of different evolved phases in different samples was calculated by Debye-Scherrer equation (cf. Table 1). Size of the anatase TiO2 was found to be 6.1 nm for the PVS-Ti(b)-1200 sample, which eventually grew to 9.9 nm and 10.4 nm for the PVS-Ti(b)-1300 and PVS-Ti(b)-1400 samples, respectively. Rutile and TiC0.3N0.7 precipitates of 2.2 nm and 2.7 nm in the PVS-Ti(b)-1300 and coarsened to 13.6 nm and 3.2 nm, respectively, for samples pyrolyzed at 1400 oC. The TiC nanocrystals were of 4.6 nm in the SiTiCNO ceramics synthesized at 1400 oC.
The Cfree phase within the PDC influences their high temperature properties such as crystallization and oxidation resistance.[16, 44, 45] Thus it is important to understand the evolution of Cfree in the prepared SiTiCNO ceramics. Fig. 6 shows Raman spectra of the SiTiCNO ceramics prepared at different temperatures, which clearly exhibits the presence of D and G bands of graphitic carbon. The D band appears due to the out of plane vibration caused by laser scattering from local defects present in Cfree, whereas the G band is a result of in-plane vibrations of sp2 bonded carbon atoms caused by tangential stretching of the sp2 bonded carbon in the graphitic structure.[46, 47] The Raman spectra of few undoped samples (synthesized in the similar conditions) were also presented in Fig. 6 for comparison purpose. The D, G peak positions, their width, and the size of Cfree were calculated (listed in Table 2) after the base line correction of spectra followed by the peak fittings using Lorentzian function.
Table 1: Size analysis of different evolved phases within the SiTiCNO ceramics.
Sample Name
|
2Ɵ
|
FWHM
|
Crystallite Size(nm)
|
Phases
|
PVS-Ti(b)-1200
|
25.2
|
1.4
|
6.1
|
Anatase-TiO2
|
PVS-Ti(b)-1300
|
25.2
|
0.86
|
9.9
|
Anatase-TiO2
|
27.4
|
3.85
|
2.2
|
Rutile-TiO2
|
42.3
|
3.3
|
2.7
|
TiC0.3N0.7
|
PVS-Ti(b)-1400
|
25.2
|
0.82
|
10.4
|
Anatase-TiO2
|
27.4
|
0.63
|
13.6
|
Rutile-TiO2
|
41.7
|
1.92
|
4.6
|
TiC
|
42.3
|
2.80
|
3.2
|
TiC0.3N0.7
|
The D and G peaks were observed in the SiTiCNO samples over the spectral range of 1326-1340 cm−1 and 1589-1614 cm−1, respectively (Table 2). In the Raman spectra of pure SiCN samples (PVS-1000 and PVS-1400), the D and G peaks appeared at ~1330 and ~1620 cm−1. Presence of these D and G Raman bands for all the pyrolyzed PVS-Ti(b) samples suggests that the formation of the Cfree phases started at earlier temperature (even at 900 oC) in the Ti doped SiCN ceramics than the undoped SiCN ceramics. It could be concluded that Ti doping in the SiCN matrix accelerates formation of the free carbon phase (Cfree).
Initially blue shift of the G bands was observed for the SiTiCNO samples pyrolyzed up to 1200 oC. The lack of meaningful signal intensity of the G peak in the PVS-1000 sample is attributable to fluorescence, which indicates substantial polymeric existence and considerable amount of hydrogen still being present in the pyrolyzed ceramic. Therefore, it could be concluded that amorphous carbon nanostructures dominate in the samples pyrolyzed up to 1200 oC. The ratio of integral intensity of D and G peaks increases for high temperature pyrolysis (cf. Table 2). The G peak from 1614 cm−1 of the PVS-Ti(b)-1200 sample clearly redshifts to 1590 cm−1 in the PVS-Ti(b)-1300 and PVS-Ti(b)-1400 samples (cf. Table 2) indicating graphitization of the Cfree.[48] However, in the Raman spectrum of the undoped PVS-1400 sample, there were no major shifts observed in the D and G peak position. Nevertheless, the D and G peaks were sharper for the PVS-1400 samples than those of PVS-1000, which could be attributed to the graphitization of the Cfree present in SiCN ceramics at 1400 oC.
Table 2: Calculation of Full width at half of maximum (FWHM) of D & G band and carbon nanodomains present in different SiTiCNO samples after pyrolysis.
Sample Name
|
D
|
G
|
FWHM(D)
|
FWHM(G)
|
(ID/IG)
|
La (in nm)
|
PVS-1000
|
1328
|
1621
|
199.98
|
359.92
|
1.59
|
3.1
|
PVS-Ti(b)-1000
|
1335
|
1601
|
125.44
|
64.91
|
1.30
|
3.8
|
PVS-Ti(b)-1100
|
1340
|
1606
|
157.71
|
67.83
|
1.63
|
3.1
|
PVS-Ti(b)-1200
|
1326
|
1614
|
127.54
|
62.97
|
2.04
|
2.4
|
PVS-Ti(b)-1300
|
1329
|
1590
|
139.10
|
57.24
|
1.95
|
2.5
|
PVS-Ti(b)-1400
|
1338
|
1590
|
130.27
|
55.52
|
1.90
|
2.6
|
PVS-1400
|
1330
|
1616
|
114.50
|
89.67
|
1.99
|
2.5
|
The FWHM of G peak for the PVS-1400 spectrum are larger than the corresponding values of G peak widths for all the pyrolyzed Ti doped PVS samples (cf. Table 2). Similar observations can be made for the \(\frac{{I}_{D}}{{I}_{G}}\) values (except for the PVS-Ti(b)-1200 sample, which was comparable) Therefore, it can be surmised that Ti doping in the SiCN matrix promotes ordering of the Cfree phase. There were no major changes in the D peak widths of the doped and undoped samples. Further, residual Cfree knot size (\({L}_{a}\)) in the SiTiCNO ceramics were calculated (cf. Table 2 for values) by using Tuinstra-Koenig relation (Eq. 3) [49]-
$${L}_{a}=\frac{C\left({\lambda }\right)}{\frac{{I}_{D}}{{I}_{G}}}$$
3
For the laser beam used in this study (laser wavelength, λ = 532 nm), C is ~4.95 nm.[50, 51] No major change in the dimensions of the nanocrystals of residual carbon between the undoped and doped samples when the pyrolysis temperature was 1200 oC or higher. The sample PVS-1000 and PVS-Ti(b)-1000 showed a larger \({L}_{a}\) than the high temperature pyrolyzed samples. The main reason behind it is the pyrolysis temperature (1000 oC - 1100 oC), which is apparently very low to eradicate remaining hydrogen attached with the carbon.[52] It is interesting to note that though the carbon segregates at earlier temperatures into SiTiCNO matrices but the lateral size of carbon nanocrystals remain fine even at 1400 oC (~ 2.6 nm size range). Therefore, it can be concluded that Ti doping to SiCN does not affect crystallite size of the Cfree phase.
The different nanostructures developed within the SiTiCNO ceramics during pyrolysis at 1400 oC as evidenced by XRD analysis, were observed through TEM/HRTEM, as presented in Fig. 7 and Fig. 8. Micrographs shown in Fig. 7a, Fig. 7b and Fig. 7c display a homogeneous distribution of the nanocrystals evolved within the SiCN matrix at different microscope resolution. In Fig. 7d, mixed precipitates of small (grayish dot structures) and relatively larger nanocrystals appear. The nanocrystals could be observed in spherical, elliptical, as well as cuboid shape, with sizes ranging from a few to 12 nm. These nanostructures were further identified by analyzing it through HRTEM as shown in Fig. 8.
Fig. 8a and Fig. 8b show different lattice fringes of the nanostructures evolved within the ceramic matrix. Also, the SiCN matrix clearly appeared amorphous in nature. The insets within the HRTEM images shows IFFT image of the selected areas for the calculation of the respective lattice fringe widths. The lattice fringe width computed as 0.32 nm corresponds to the d-spacing of (110) plane of rutile-TiO2 (JCPDS file No. 77-0441). The fringe widths corresponding to 0.35 nm, and 0.24 nm, belong to the d-spacing of (101) and (004) planes of anatase-TiO2 (JCPDS #21-1272), respectively. Also, the fringe width measured as 0.25 nm corresponds to the d-spacing of (111) plane of TiC (JCPDS file no. 73-0472). These observations of the different phases in an amorphous SiCN matrix are in confirmation with the X-ray diffractograms (Fig. 6). Other than these, an unusual lattice fringe of 0.445 nm width was reported, which belongs to (200) plane of the silicon oxynitride (Si2N2O) phase (JCPDS file No. 84-1814). Although Si2N2O phase did not appear in the XRD pattern, in the given circumstances the only plausible phase belonging to the lattice width of 0.445 nm could be of Si2N2O. The formation mechanism and sequence of the Si2N2O phase in the SiTiCNO system is not clear at the moment. However, Si2N2O phase had been developed earlier in a similar system by Cheng et al. through polysilyloxycarbodiimide precursors derived SiCN system.[53] The TiC0.3N0.7 nanocrystals are not identified through the HRTEM images, probably due to the low amount and random distribution. However, the grayish dot like nanostructures (Fig. 7d) could be referred to the TiC0.3N0.7 phases, since their crystallite size calculated through diffraction curve (~3.2 nm) belongs in the size range of the crystals observed in the TEM micrograph. The average crystallite size of rutile-TiO2, anatase-TiO2, and TiC measured in HRTEM micrographs were 11.5 nm, 10.7 nm, and 5.2 nm, respectively, which are in good agreement with the crystallite sizes obtained by the Scherrer equation (cf. Table 1). TEM micrographs clearly show that these interphase nanoparticles are fully separated by SiCN glass boundaries and are well distributed within the amorphous ceramic matrix.
In many previous studies, efforts have been made to develop Ti doped SiCN/SiOC ceramics with a stable nanostructure at high temperatures. The dopant precursor sources influence the evolution of nanostructures within the PDC during pyrolysis, which consequently influence materials properties. For instance, TiN nanocrystals within SiOCN matrix were observed from the thermolysis of titanium tetrabutoxide modified polyhydridomethylsiloxane at 1000 oC in ammonia, and subsequent annealing at 1200 oC in nitrogen.[54] In another work, titanium isopropoxide modified polymethylphenylsilsesquioxane precursor formed TiC-SiOC ceramics at 1000 oC.[55] The TiC within the SiOC significantly improved the oxidation resistance of the SiTiOC nanocomposite. Ti doping using titanium isopropoxide to polyvinylsilazane resulted in the precipitation of anatase-TiO2 within the SiCN ceramics at 1100 oC and a small fraction of the anatase-TiO2 phase converted into rutile-TiO2 at 1200 oC.[37] Such nanocrystallites of anatase-TiO2 within the SiCN ceramic matrix improved ceramic yield (during pyrolysis) as well as oxidation resistance of the ceramics up to 1400 oC. Further, the pyrolysis of titanium tetrabutoxide altered polyhydridomethylsiloxane precursor led to the formation of nanocrystallites of anatase-TiO2 in SiOC matrix that remained stable up to 1200°C.[56] Similarly, in the current investigation the rutile-TiO2 was found predominantly at 1300°C and 1400 oC in the amorphous SiCN matrix. TiC is a high temperature ceramic (melting point of 3067 oC) that shows excellent resistance towards high temperature creep, corrosion, and thermal shock. [57] Further, TiC shows high hardness (28–35 GPa), high elastic modulus (450 GPa) and good thermal conductivity (22–35 W/(m·K)). [58] Formation of TiC in the SiTiCNO composite in the current investigation imparts beneficial high temperature properties. The formation of TiC0.3N0.7 is very rare and it has got properties similar to that of TiC and TiN.[58] Moreover, Si2N2O has low diffusion coefficient and shows excellent properties, such as excellent oxidation resistance (up to 1600°C), high thermodynamic stability (up to 1800°C and more stable than Si3N4), high flexural strength (up to 1400°C), high thermal shock resistance, and high fracture toughness.[59, 60] The carbon in the PDC matrix acts as barrier and improves their thermal stability towards crystallization and decomposition.[16] Therefore, assimilation of all the results and the formed phases indicates the formation of a multicomponent multiphase nanocomposites ceramics with the simple doping of Ti in a polysilazane based preceramic polymer. The formation of such a composite with nanostructured phases of TiO2, C, TiC, TiC0.3N0.7, and Si2N2O dispersed in an amorphous SiCN matrix, which is stable at 1400 oC, promises structural stability and better high temperature properties. These compounds merit exploration as functional materials, high temperature coatings, and engineered intergranular phase compounds in bulk ceramic components.