This work has studied the introduced devices with different active layer thicknesses and various D/M/D thicknesses. The thicknesses of active layers are 53, 59, 72, 91, 100, 114, 143 nm, and DMD (Top contact) thickness are 10 (nm)/dm/30(nm) with dm: 4, 6, 8, 10, 12, 14, 16 nm. We first examined our model’s accuracy in comparison with experimental data reported for the device in Ref.[29], in which the D/M/D thickness is fixed to 10nm/6nm/30nm, and active layer thickness varies from 53nm to 143 nm. As shown in Figs. 2–4, the obtained results are in very good agreement with the experimental results. The characteristics parameters are listed in Table 1. To model the ST-OSC’s performances, one has to know the absorption coefficient for the structures. For this purpose, we calculated the absorption coefficient and fitted it to the absorption coefficient reported experimentally in percent. The fitted relation has presented in Eq. 3:
\(\begin{gathered} \hfill \\ {\alpha _L} \approx \left( {\frac{{\left( { - 37.12+100\lambda } \right)+\left( {0.97 - 3e6\lambda +2.85e12{\lambda ^2}} \right)L}}{{\left( { - 37.12+100\lambda } \right)+\left( {0.97 - 3e6\lambda +2.85e12{\lambda ^2}} \right){L_0}}}} \right) \times {\alpha _{{L_0}}};{\text{ (3)}} \hfill \\ \end{gathered}\)
where \(\lambda\)is the wavelength, and L, and L0 are the active layer thicknesses. Knowing the absorption coefficient, \({\alpha _{{L_0}}}\), in a thickness such as L0, one can find the absorption coefficient for any other thicknesses.
Figure 2 shows the J-V curve of the devices with structure of ITO/ ZnO/ PBDB-T: ITIC/ MoO3/ Ag/ MoO3, with fixed thickness of D/M/D in 10nm/6nm/30nm, and PBDB-T: ITIC active layer thickness is: a) 53, b) 59, c) 72, d) 91, e) 100, f) 114, g) 143 nm. It is clear from the figures, that there is very good agreement between our model and experimental results. This figure indicates that all devices have the same Voc, which is close to 0.85 V. This value is ~ 0.2 V higher than devices containing traditional fullerene receptors, due to the high LUMO of non-fullerene acceptors[21]. This is a major factor that helps to improve the photovoltaic performance of this material system. As the active layer thickness was increasing, the Jsc also is increasing.
Table 1
Parameters used in the calculation for the device modeling.
Parameter | value |
NA (1/cm3) | 5e25 |
ND (1/cm3) | 5e25 |
Nc (1/cm3) | 8e27 |
Nv (1/cm3) | 8e27 |
Electron Lifetime(s) | 8.5e-6 |
Hole Lifetime(s) | 7.5e-6 |
V built−in (eV) | 1.14 |
Mobility (electron, hole) | variable |
The transmittance spectrum of the ST-OSC for different active layer thicknesses is calculated and compared with those experimental data. The transmittance spectrum of the ST-OSC with an active layer of 100nm is presented in Fig. 3a, as an example. The figure shows the experimental transmittance for whole devices, besides, the calculated transmittance of the: MoO3/Ag/MoO3 anode, ITO and ZnO compact layer, the active layer, and the whole device. Moreover, for a better understanding of the device’s semi-transparency, AM1.5 spectral irradiance, \({S}_{AM1.5}\left(\lambda \right)\), and \({S}_{AM1.5}\left(\lambda \right)*V\left(\lambda \right)\) are demonstrated. It can be seen that there is a good agreement between the obtained transparency for the device and the experimental data. Also, the error bar is included which shows the model’s accuracy. In the wavelengths of FWHM of \({S}_{AM1.5}\left(\lambda \right)*V\left(\lambda \right)\), the ITO and ZnO compact layer has more than 85% transparency, and the MoO3/Ag/MoO3 anode transparency is about 60–75%, and active layer transparency is about 35% ~ 50%.
In Fig. 3b, the calculated transmittance of the ST-OSC for different active layers thickness is presented. As shown in the figure, the transmittance of the ST-OSC with thin active layers thickness (53–72 nm) is higher than 25% at all wavelengths of FWHM of \({S}_{AM1.5}\left(\lambda \right)*V\left(\lambda \right)\), which makes it much suitable for widow application. By exceeding the increment of the active layer thickness, the transmittance of the ST-OSC decreases, whereas, for a longer wavelength, it decreases to less than 25%. However, the AVT of the solar cells in the visible region (370–740 nm) of the devices with active layer thickness thinner than 100 nm is higher than 25% and still suitable for widow application.
In Table. 2, we compared the parameters of the solar cell such as short-circuit current, open-circuit voltage, FF, PCE, and AVT of the modeled devices with experimental data[23]. As expected, with increasing the thickness of the active layer, the absorption increases, and consequently PCE increases. In contrast, the fill factor (FF) declined with increasing active layer thickness. Although the Jsc is highest for the active layer with a thickness of 143 nm, the FF is low and is 49.6%. The decrease in FF is associated with an increase in recombination, consequently an increase in series resistance and a decrease in shunt resistance values. Optimum PCE is obtained at an active layer thickness of 100 nm with a maximum PCE value of 9.32%. To the best of our knowledge, this PCE is one of the few reported PCEs with more than 7% for a single-junction semitransparent OSC.
Table 2
The model devices' essential parameters compared to experimental data [].
Thickness (nm) | Jsc (mA/cm2) | Voc (V) | FF (%) | PCE (%) | AVT(%) |
Th. | Exp. | Th. | Exp. | Th. | Exp. | Th. | Exp. | Th. | Exp. |
53 | 7.33 | 6.85 | 0.853 | 0.884 | 59.50 | 66.5 | 4.79 | 4.2 | 33.5 | 35.3 |
59 | 8.94 | 8.41 | 0.86 | 0.89 | 63.95 | 66.9 | 6.4 | 5.2 | 32.0 | 33 |
72 | 9.5 | 8.75 | 0.863 | 0.897 | 54.75 | 63.2 | 5.66 | 5.01 | 28.8 | 31.1 |
91 | 13.30 | 12.62 | 0.867 | 0.87 | 59.57 | 59.4 | 8.81 | 6.8 | 23.6 | 26.6 |
100 | 14.28 | 13.8 | 0.867 | 0.886 | 59 | 59 | 9.32 | 7.4 | 21.5 | 25.2 |
114 | 14.76 | 15.08 | 0.854 | 0.87 | 55.51 | 51.5 | 9.02 | 6.8 | 18.3 | 23.2 |
143 | 15.14 | 13.82 | 0.854 | 0.89 | 49.41 | 49.2 | 8.21 | 6.3 | 14.7 | 20.2 |
As can be seen from the Table. 2, and Fig. 4, The PCE increases with increasing active layer thickness until it reaches a maximum value at the thickness of 100 nm. For thicknesses thicker than 100nm, PCE is reduced due to the decreasing of FF. Unlike the PCE, the AVT decreases linearly with increasing active layer thickness. For the devices that can be used as a window, the device with an active layer of 100 nm has the highest PCE.
It is well known that organic thin-film solar cells act as multilayer optical cavities in which the distribution of the optical field is governed by the effect of optical interference, due to the reflection of the incident light at the layer interfaces [30]. In the studied devices, the D/M/D top contact which includes 3 layers can be an important layer for optical interference. To find out the effects of D/M/D layers on the device performance, D/M/D (6nm/dm/40nm) layers with different thicknesses of the metal layer, ‘dm’, have been analyzed. For this purpose, each reported device in Table 2, with fixed active layer thickness has been studied using different metal thicknesses in the D/M/D layer, dm. We have calculated all performance parameters such as the J-V curve, EQE, T, and AVT. As an example, for the devices with the active layer thickness of 53 nm, and dm: 4, 6, 8, 10, 12, 14, 16 (nm), the performance parameters are presented in Fig. 5. As shown in Fig. 5a, with increasing the metal thickness, JSC increases, but the VOC does not change. In these devices, the exciton generation rate depends on the optical field intensity which is located close to the anode/active layer interface when light enters through the D/M/D electrode under top illumination[31]. So, the ‘dm’ thickness changes can dominantly affect the JSC values. Fig. 5b shows the EQE of the devices as a function of wavelengths, in which the highest EQE value belongs to thick ‘dm’, dm=16nm. For all devices, the transmittance is higher than 25% for most visible wavelengths (Fig. 5c). Finally, Fig. 5d shows the AVT of the devices as a function of ‘dm’ thickness. The AVT of all devices is higher than 36% and the maximum AVT is obtained for dm=6nm. So, all devices can be used in the windows application.
All performance parameters for the device are presented in Table. 3. As depicted in the table, all devices are practical for the window application with different PCE, while the highest value for PCE is for dm=16nm. Also, the highest AVT was achieved for dm=6nm, with 3.11% PCE.
Table 3
The performance parameters for the device with an active layer thickness of 53 nm.
dm (nm) | JSC (mA/cm2) | FF(%) | Voc (V) | PCE(%) | AVT(%) |
4 | 5.55 | 55.49 | 0.82 | 3.27 | 45.40 |
6 | 5.35 | 54.66 | 0.82 | 3.11 | 46.27 |
8 | 5.36 | 54.60 | 0.82 | 3.10 | 46.00 |
10 | 5.58 | 55.28 | 0.82 | 3.28 | 44.59 |
12 | 6.70 | 57.86 | 0.84 | 4.19 | 42.49 |
14 | 5.96 | 55.68 | 0.84 | 3. 59 | 39.61 |
16 | 6.74 | 57.98 | 0.84 | 4.22 | 36.48 |
In Fig. 6, we have presented the J-V curves of the devices with different active layer thicknesses and various dm thicknesses. The figure shows that any change in dm thickness doesn’t change the VOC values. The JSC increases with increasing dm and reaches 14.88 mA/cm2 for the sample with an active layer thickness of dm=16nm, where the fill factor is the lowest valve (46%-48%) in comparison with other samples. From the point of view of the fill factor, the sample with dm= 16 nm and the active layer of 59nm has the maximum FF, 70.49%.
In Fig. 7, the devices’ JSC, FF, and PCE are presented as a function of ‘dm’ thickness and for various active layer thicknesses. As shown in the figure, for any fixed active layer thickness, with increasing ‘dm’, the JSC is increasing slightly, and the FF is almost constant, so, the PCE increases slightly. With increasing the thickness of active layers for any fixed ‘dm’, the JSC is increasing, and the FF hasn’t any certain functionality, then, the PCE increases and reaches a maximum, decreases. The maximum value of PCE happens for samples with an active layer of about 100 nm. For devices with a thicker active layer (more than 100 nm), the FF was lower due to the increase in series resistance, which could be due to the distorted distribution of exciton generation within the active layer (most excitons are generated near the anode/active layer interface) and subsequent carrier transport towards respective electrodes.
To show the applicability of the studied devices in the windows application, the AVT values of the devices are shown in Fig. 8. By increasing the active layer thicknesses, the AVT is increasing, then decreases almost linearly. The maximum value for the AVT belongs to the ST-OSC with the active layer thicknesses of 59nm (see Fig. 7c). As shown in the figure, for a fixed active layer thickness, the AVT value has a maximum at dm=6nm, then with increasing the dm value, the AVT decreases. The figure shows that all devices with different dm and active layer thicknesses thicker than 114 nm deserve semitransparent solar cell conditions.
The CIE color space, including the coordinates of ST-OSC consisting of different active layer thicknesses and different ‘dm’, is shown in Fig. 9. The color coordinates of translucent OSCs with an active layer thickness of about 90–100 nm are located close to the color point or so-called "white dot" in the CIE chromaticity diagram. Proximity indicates that there is a good achromatic or neutral color sensations when looking through devices under AM1.5G illumination. Hence, these devices can transmit high-quality light with near white sensation to the human eye without changing the original color of an object. However, as the thickness of the active layer changes, the color coordinates move in different directions from the white dot. Also, the coordinates are sensitive to dm values, and both coordinates x and y increase with increasing dm (see the inset of Fig. 9). For a device with the best PCE and AVT, the thickness of the active layer is 100 nm and the color coordinates are slightly away from the achromatic point, however, the device does not alter the transmitted light by a large extent.