The front TCO passivation effect of absorber layer major dependence is not shown but it is realized critical with thickness. The SnO2 and ZnO as TCO layer layer the significant variation of FF is realized however, Jsc is shown to vary in opposite trend. The FF for SnO2 is shown very low in comparison to ZnO for the similar thickness and all other design parameters are retained the same. The CdSe and CdS emitter layer optimized thickness and electrical properties are analyzed. The variation of CdSe and CdS emitter is also shown less significant. CdSe emitter Jsc is increased while CdS emitter Voc is increased. The band gap of SnO2 is greater than ZnO and the electron extraction for ZnO is more preferable than SnO2 due to barrier effect [10]. Therefore, the FF variation is perceived. The back surface field contact design for electrical performance and back metal contact significance is widely analyze in this study. P-type ZnTe as buffer passivation, conductive property and thermoelectricity perspective are influential. Increasing ZnTe BSF thickness CdTe cell Voc and efficiency is increased. The majority carrier conduction is possibly increased with thicknes and the details are reported later.
3.1 CdTe HJ electrical analysis
The variation of current density for ZnO and SnO2 TCO layer for diverse thickness of CdSe/CdTe HJ cell is reported. ZnO greater thickness is shown to decrease short current density whereas it is increased with SnO2 as it is shown in Fig. 3.
The thinner SnO2 layer lowest Jsc is realized but increasing SnO2 thickness the current density is shown to increase a bit whereas current density is decreased with increasing ZnO layer thickness as shown above. The band gap of SnO2 is higher than ZnO so the transparency of greater thickness of SnO2 comparison to ZnO is obvious. However, FF is not shown promising for SnO2 TCO layer and Voc is shown lower for CdSe in contrast to CdS emitter. The ZnO/SnO2 and CdSe/CdS band gap and Voc of CdS/CdTe HJ is shown below Figure 4 (a) and (b).
Due to ZnO TCO the trend of increasing of Voc with TCO thickness. The effect of ZnTe back buffer on Voc is investigated. It is revealed that the back barrier thickness is influenced on electrical performance of CdTe cell. In our study the variation of ZnTe thickness is sensibly increased Voc. It is possibly due to the buffer contact to adjust the barrier between CdTe and metal back contact results in increase Voc and efficiency. But optimized ZnTe layer with diverse metal back contact the Voc and FF is reported later. The open circuit voltage, Voc = 0.9757 V and efficiency 19.92% is achieved for 90 nm of ZnTe BSF thickness as it is shown in Fig. 5.
The current density and FF of CdS/CdTe HJ cell with diverse thickness of ZnTe layer is shown below Fig. 6 (a) and (b). The trend of decreasing of both FF and current density are observed with increasing ZnTe thickness though it is less significant.
3.2 CdTe back metal contact electrical effect analysis
Metal work function (ɸm) is greater than the work function of semiconductor. Due to contact the electrons from the active layer can be tunnel into the metal thus BSF barrier effect is potential for band bending so electrons moving back from metal to semiconductor.
$${\varnothing }_{B} = {\varnothing }_{m} – \chi$$
1
ɸB is the barrier height is determined by the metal barrier, ɸm and the electron affinity, χ. Two different metals Copper (Cu) and Molybdenum (Mo) are engaged with ZnTe BSF to study the electrical and opto-electrical (EQE) analysis.
Table 1
The output for different metal back contact used
Metal work function (ɸm) (eV)
|
Voc (V)
|
Jsc(mA/cm2)
|
Fill Factor
|
Efficiency
|
Copper (Cu)
|
4.7000
|
0.8790
|
24.16
|
84.75%
|
18.0%
|
Molybdenum (Mo)
|
4.7600
|
0.9390
|
24.16
|
84.60%
|
19.4%
|
Table 1 shows diverse electrical output of CdTe PV for two different back metal contacts. As it can be seen from the table, increasing metal work function has increased the Voc and efficiency. Mo highest melting point whereas copper high thermal conductivity is attractive. Cu is much cheaper and more easily obtainable than Mo. Between these two metals Mo yields energy output or higher efficiency is understood. The electrical performance of opto-electrical materials is critically related to the QE. To validate the data for Mo and Cu back metal contact of CdTe thin film solar cells QE is studied as it is shown in Fig. 7. The EQE of a device is the key parameters to determine its opto-electrical performance. EQE of conventional CdTe and the designed optimized CdTe solar cell using both Mo and Cu back contacts are demonstrated. The dotted line shows the maximum theoretical quantum efficiency and green line of both figures for convention cell EQE. The blue line of Fig. 7 (a) for Mo back contact and the turquoise line for Cu back contact is shown in Fig. 7 (b). Around 550 nm the EQE is realized highest and it is about 82% for Mo and 80% for Cu metal contact. Beyond that wavelength QE is gradually decreased and at 870 nm it is sharply reduced to zero. The variation of conventional and optimized cell EQE is clearly observed.
The optimized model and layout is shown in Fig. 8. Voc is shown to increase with ZnTe thickness which is resembled that the p-CdTe majority carrier conduction is increased until certain thickness while minority carrier is suppressed to recombine. It is possibly due to the effective band barrier of minority carrier by ZnTe material and this barrier may improve thermal stability. The effective barrier at the back for CdTe solar cell is eventually improved the open circuit voltage. However, the Jsc, for the optimized cell is shown to decrease for both metal contact and Voc is decreased for Cu contact while FF is increased. Efficiency of solar cell is depending on Voc, Jsc and FF. Since the relatively greater passivation layer thickness increases the majority carrier transport and conduction thus Mo metal and ZnTe BSF contact has optimize the FF. Due to lessening of current density the efficiency is not significantly increased. Both TCO and ZnTe buffer thickness impact on carrier generation and majority carrier accumulation whereas work function of back metal contact is declined Jsc [11]. However, the Voc, FF and efficiency is realized to increase even at low work function metals contact that is the key consideration of CdTe TF numerical analysis.