3.1. Structural properties
XRD patterns of Cd doped CeO2 films are shown in Fig. 2. All the diffraction peaks are seen in all the spectra, referred to cubic fluorite structure and matched with data available in ICDD (81–0792). No impurity peaks has been observed in all the films [27]. A decrease in the maximum intensity of the peaks is noticed with the addition of Cd. Because, the Ce+ 3 with an ionic radius of 1.1 Å is larger than the Cd+ 2 ion with an ionic radius of 0.97 Å. As the doping level increased, doping ions are occupied the intermediate sites. Crystallite size (D) of the films has been obtained from Scherrer’s equation;
where 0.9, contant value; λ, the wavelength of CuKα radiation; β, the full width at the half-maximum of the peak and θ is the Bragg angle of the corresponding peak [28–31]. For the (2 0 0) peak that indicates the preferred orientation, the crystallite size of CC0 film has been calculated as 44 nm which gives information about the grain boundaries, defects, and also mechanical properties of crystals such as hardness or brittleness. The internal macro-stress or compaction due to doping, pressure and temperature effects during the formation of crystals is expressed as follows [32, 33].
$$<e>=(d- {d}_{0})/{d}_{0}$$
where d indicates the distance between the experimentally calculated crystal parallel planes corresponding to the peak (2 0 0) and d0 shows the parallel inter planar distance in the absence of the standard distortion between the crystal planes given on the ICDD card. If the \(e\)values positive, there is macro strain; if negative, there is stress in the crystal structure. The intensity of linear defects (δ), especially in amorphous and polycrystalline structures, and the surface linear defect density (δ) have been calculated by Williamson and Smallman method using the following expression:
In crystal studies, n = 1 is generally taken. The linear defect density value is small and the degree of crystallization is good [34, 35].
Table 1
Some data of Cd doped CeO2 films obtained from XRD pattern.
Film | 2θ(°) | d(Å) | 2θ0(°) (ICDD) | d0(Å) (ICDD) | (h k l) |
CC0 | 29.03 | 3.074 | 28.55 | 3.124 | (1 1 1) |
33.69 | 2.658 | 33.08 | 2.706 | (2 0 0) |
48.09 | 1.891 | 47.49 | 1.913 | (2 2 0) |
59.49 | 1.553 | 59.10 | 1.562 | (2 2 2) |
69.91 | 1.356 | 69.42 | 1.353 | (4 0 0) |
CC10 | 28.99 | 3.078 | 28.56 | 3.124 | (1 1 1) |
33.53 | 2.673 | 33.08 | 2.706 | (2 0 0) |
48.08 | 1.892 | 47.49 | 1.913 | (2 2 0) |
59.68 | 1.549 | 59.10 | 1.562 | (2 2 2) |
69.62 | 1.351 | 69.42 | 1.353 | (4 0 0) |
CC20 | 29.19 | 3.059 | 28.55 | 3.124 | (1 1 1) |
33.61 | 2.667 | 33.08 | 2.706 | (2 0 0) |
48.26 | 1.886 | 47.49 | 1.913 | (2 2 0) |
59.88 | 1.545 | 59.10 | 1.562 | (2 2 2) |
69.95 | 1.344 | 69.42 | 1.353 | (4 0 0) |
CC30 | 29.22 | 3.057 | 28.55 | 3.124 | (1 1 1) |
33.58 | 2.667 | 33.08 | 2.706 | (2 0 0) |
48.33 | 1.883 | 47.49 | 1.913 | (2 2 0) |
56.98 | 1.616 | 56.35 | 1.632 | (3 1 1) |
70.08 | 1.343 | 69.42 | 1.353 | (4 0 0) |
CC40 | 29.24 | 3.054 | 28.55 | 3.124 | (1 1 1) |
33.72 | 2.658 | 33.08 | 2.706 | (2 0 0) |
48.17 | 1.889 | 47.49 | 1.913 | (2 2 0) |
60.03 | 1.541 | 59.10 | 1.562 | (2 2 2) |
70.24 | 1.339 | 69.42 | 1.353 | (4 0 0) |
CC50 | 29.24 | 3.054 | 28.55 | 3.124 | (1 1 1) |
33.56 | 2.671 | 33.08 | 2.706 | (2 0 0) |
48.09 | 1.892 | 47.49 | 1.913 | (2 2 0) |
59.45 | 1.555 | 59.10 | 1.562 | (2 2 2) |
69.81 | 1.347 | 69.42 | 1.353 | (4 0 0) |
Table 2
Structural parameters of Cd doped CeO2 films.
Film | β(°) | D (nm) | <e> | δ (1/nm2) |
CC0 | 0.187 | 44 | -0.0177 | 5.17x10− 4 |
CC10 | 0.064 | 130 | -0.0122 | 5.92x10− 5 |
CC20 | 0.048 | 180 | -0.0144 | 3.46x10− 3 |
CC30 | 0.078 | 81 | -0.0144 | 1.52x10− 4 |
CC40 | 0.089 | 93 | -0.0177 | 1.16x10− 4 |
CC50 | 0.089 | 93 | -0.0129 | 1.16x10− 4 |
3.2. Optical properties
Figure 3 indicates the tranmittance spectra of the films between the 300–900 nm wavelengths. It is clear from these spectra that film presents the increasing absorbance values between the 375–400 nm that indicates the optical band edges of the CeO2 film. Optical band gap energy (Eg) of the films has been calculated by optical method using (αhν)2∼ (hν) plot and shown in Fig. 4.
(αhυ) = A(hυ-Eg)n
In where, A is a constant, α (in cm− 1) is the linear absorption coefficient, and hυ is the energy of incident photons. As for the exponent, the value of n depends upon the type of the transition that may have values 1⁄2 and 2 corresponding to the allowed direct and indirect transitions [36–39]. Since these films have a direct band structure, n was taken to be 1⁄2 for the allowed direct transition.
The plot of (αhν)2 vs hν is displayed in the inset of Fig. 4. Eg values of the Cd doped CeO2 films are in the range of 3.23–3.52 eV, and are higher than of the bulk CeO2 (3.2 eV) [40, 41].
PL spectroscopy is a rapid and non-limiting technique for the determining the optical properties like defect levels of semiconductor crystals [42]. Figure 5 shows PL spectra in the 400–800 nm wavelength range and 380 nm excitation wavelength to determine this behavior of Cd doped CeO2 films. PL emissionis observed from violet to red region. Additionally, many shoulder peaks are located in the blue region due to surface-related defects, while other peaks are due to dislocations or oxygen vacancies. It can be seen that the PL intensity of Cd doped CeO2 is lower than that of undoped CeO2. An green emission band is due to the transition from the Cd donor level to the oxygen vacancies level localized in the CeO2 band gap [43, 44]. Since Ce+ 4 and Cd+ 2 have different covalent and ionic radii, it is thought that replacing Ce with Cd will create oxygen vacancies (Vo++) to maintain neutrality [27, 37]. CeO2 show outstanding catalytic activity in most of the chemical reactions, for properties oxygen storage capacity, that readily changes between Ce+ 3 and Ce+ 4 states. In addition, there are many overhanging bonds and defects on the surface of CeO2 films [40]. Kumar et al. [41] have stated that as the O− 2/O− surface system is the trap of the holes in the valence band of doped CeO2 plays role in the formation of visible emission centers (Vo++) [42–45].
Raman spectra of Cd doped CeO2 films as shown in Fig. 6. Raman spectra show the second order transverse acoustic (2TA) modes at ~ 250 cm− 1, a defect-induced (2TO) mode at ~ 600 cm− 1, and the second order longitudinal optical mode (2LO) at ~ 1170 cm− 1 [45–48]. Also, there is an intense peak at 461 cm− 1, which related to the F2g symmetrical mode of the fluorite structure [45, 46]. The peak at 570 cm− 1 related to the LO mode of fluorite-structured cerium oxide materials, that is, to the oxygen vacancy (Vo) defects in the structure [47, 48].
3.3. Surface properties
SEM images of Cd doped CeO2 films are showed Fig. 7. Generally, morphology of Cd doped CeO2 films can be classified into three structures: small dots in whitish color, large bright plates, and matrix that spreads over the surface in pale colored regions. SEM image corresponding to the element mapping images of Ce, O and Cd elements distributed uniformly within the composites is given Fig. 8. The elemental composition of the films is carried out by EDX method, and the data are also given in Table 3. According to the EDS spectrum, the cerium atoms in the sprayed CeO2 film have been determined as more dominant than oxygen in percentage.
Table 3
Compositional analysis of Cd doped CeO2 films.
Film | CC0 | CC10 | CC20 | CC30 | CC40 | CC50 |
Wt (%) O | 20 | 27 | 21 | 25 | 37 | 32 |
Wt (%) Cd | 0 | 10 | 15 | 18 | 28 | 31 |
Wt (%) Ce | 80 | 63 | 64 | 57 | 35 | 37 |
Cd doped CeO2 films that are used as anti-reflective layers on solar cells should have suitable surface roughness and should pass the sunlight to the absorber layer of the solar cell as much as possible. Because each photon absorbed by the absorber layer forms an electron-hole pair hindrance to the passage of photons by the anti-reflective layer will lower the efficiency of the cell. So that, the AFM images are utilized to examine the atomic (grain) aggregates on the resulting sprayed film surface and given in Fig. 9. The sprayed films are formed on glass substrates, and surface morphology of the crystal structure cannot be homogeneous because the surface of the glass substrates which has defects due to missing chemical bonds. Even if the formation of Cd doped CeO2 films is weak, the grown crystal structure tends to follow the crystal structure of the substrate. The hills and valleys in the 3D AFM image of the sprayed CeO2 films are formed as a result of different atomic stacks. The appearance of white hills also could be attributed to the accumulation of excess atomic clusters in these regions which causes the thinner film formation in the valleys. The thermal shock effect and the spray cones are more likely to form these valleys.
Table 4
Roughness values of Cd doped CeO2 films.
Film | CC0 | CC10 | CC20 | CC30 | CC40 | CC50 |
Rpv (nm) | 485 | 300 | 149 | 193 | 326 | 541 |
Rq (nm) | 58 | 22 | 20 | 31 | 36 | 61 |
Ra (nm) | 45 | 15 | 16 | 25 | 29 | 47 |
3.4. Photodegradation of the Cd doped CeO2 films
Methyl orange is a real pH indicator. It is an organic substance that changes color depending on the pH of the environment. In an acidic medium, methyl orange is red, while in an alkaline medium, its color turns yellow. In addition, methyl orange, a colored organic substance, is in the azo dye (–N = N–) class. In addition, dyestuffs in this class are also defined as pollutants due to their negative effects on human and environmental health [49]. Therefore, such substances need to be removed or even destroyed from environmental and food samples.
The photodegradation technique is the simplest, fastest, most economical, and environmentally friendly for the removal of pollutants. Therefore, the capacitance of Cd doped CeO2 thin films produced in different components for the removal of the methyl orange as a indicator was investigated under UV light. Therefore, first of all, standard methyl orange solutions were prepared precisely and a calibration chart was created in Fig. 10 scanning the overall absorbance of the UV-Vis spectrophotometer from 300 to 800 nm.
For the methyl orange removal study, it has been first kept in thin films for 30 minutes in a dark environment. Then, it has been kept under UV light for about 6 hours and the absorbance of the solution has been measured with a UV-vis spectrophotometer for each 30 minutes. At the end of 6 hours, the capacities and kinetic models of Cd doped CeO2 films used in the removal of methyl orange have been explained. The performance of the photocatalyst in the degradation of organic dyes with CeO2:Cd catalyst has been determined by the degradation rate of the dye, known as the kinetic data. These models have been based on the Langmuir- Hinshelwood kinetic equation:
$$-\text{ln}\left(\frac{C}{{C}_{0}}\right)=kt$$
According to the equation, the time-dependent ln(C/C0) graph can be drawn and the photocatalytic rate constant (k) value can be calculated from the slope of this graph [50, 51].
The changes in concentration, percent degradation, and the time-dependent ln(C0/C) curves for the methylene orange solution as a function of irradiation time for CeO2:Cd films are shown in Fig. 11 (a, b, and c), respectively. The initial concentration of methylene orange is C0 = 4x10− 4mgL− 1 as shown in Fig. 11 (a). There are some important issues when studying the photocatalytic reaction. Examples include the absorption of light by a semiconductor to form electron-hole pairs, charge separation and transport to the surface of the semiconductor, and reactant adsorption and surface reactions. Studying the light absorption properties of materials is crucial in the context of photocatalysis because it helps determine the efficiency of a photocatalyst in harnessing light energy to drive chemical reactions. Before investigating the photocatalytic performance of the samples, the light absorption property of Cd doped CeO2 photocatalysts is studied by UV–Vis the absorption spectra shown in Fig. 4. It can be seen Fig. 4, Cd doping clearly impress light absorption characteristics of CeO2. When the XRD patterns are examined and the crystallinity value is calculated in Table 2 it is observed that the grain size increases with the amount of additive. Although the grain size increases, it shows that the deformation of the crystal is low with small macrostrain values. According to AFM images, there are formations like building blocks formed on the surfaces of Cd doped CeO2 films. Together with higher RPV roughness values, it may cause better adhesion of methylene orange to the film surface. Such an effect may be due to defects that restrict the recombination of electron–hole pairs along with the Cd doping. Increasing the defect states for Cd doped CeO2 films may cause more carriers to be transferred to the film surface and dye molecules may cause the Cd doped CeO2 films to react [52]. Dye molecules adsorb on the photocatalysis surface. Degradation of organic pollutant is an important process.In addition, the surface texture of Cd-doped CeO2 films (micro-sized block structures and valleys consisting of nano-sized particles) is of great importance.