Current methods of characterizing electromagnetic(EM)-pulse can be divided into two classes,one is based on photons replica of the EM-pulse under test and the other on electrons replica. Methods in first class, such as interferometry and spectrography, are difficult to be competent for characterization of EM-pulse with attosecond(AS)-level duration due to too short duration or too broad bandwidth. Methods in second class, such as streak camera method, is competent but demands the pulse to have a peak strength high enough for efficiently producing X-ray photons. We propose a simple, universal method without special demand on the peak strength. It uses conventional optics method to sample, in AS-level step, wavefronts of the EM-pulse under test. Phase information carried by each sampled wavefront is fixed into, as a long-life trace, solid-state circuit and hence allow recording raw measurement data to be conducted over a feasible longer time scale.