A multilayer stack with Ta(5nm)/Pt(6nm)/[Ni80Fe20(3nm)/Pt(1nm)]×10/Au(3nm) structure was deposited on a thermally oxidized Si substrate at room temperature by DC magnetron sputtering. We first investigate the structural characteristics of the as-deposited and the annealed samples to understand the impact of the annealing on the microstructure of the stacks. Figure 1(a-b) show the atomic force microscopy (AFM) images of the as-deposited and annealed samples, respectively. The surface roughness is about 0.5 nm for the as-deposited while it is increased to approximately 5 nm for the annealed sample. The magnetic domain patterns which are measured by the magnetic force microscopy (MFM) for the as-deposited and annealed samples without an external field, are presented in Fig. 1(c-d), respectively. In the as-deposited sample, as demonstrated by the uniform color contrast, the magnetization is in the plane, while in the annealed sample, the magnetic domains formed in a labyrinthine pattern which can indicate that domains do not orientate purely in the plane 17. Field emission scanning electron microscopy (FESEM) was employed to characterize the structural and morphological properties. In Fig. 1(e-f) which display the FESEM images, one can observe that the as-deposited sample is uniform, however after annealing, the film surface is rough and planar nano-sized grains are formed. In general, from surface morphology characterizations, we conclude that a higher surface roughness can be observed for the annealed sample which can affect the iDMI consequently.
The X-ray pattern of the samples, presented in Fig. 1(g) indicate that Ni80Fe20 (Py) forms a face-centered-cubic structure of the type Ni3Fe (Reference code: 96-90-3942, Space Group: Pm-3m, 221) in both as-deposited and annealed samples. The intensity of Py and Pt peaks are more pronounced in the annealed samples. This indicates that the degree of crystallinity for the Py and Pt layers are appreciably improved after annealing. The improved crystallinity of the annealed sample is important for the presence of iDMI at the interfaces, which will be discussed later.
The hysteresis loops of the samples which are measured for the in-plane (IP) and out-of-plane (OP) configurations using a Vibrating-sample magnetometer (VSM) system are presented in Fig. 1(h). It can be seen that neither the as-deposited nor the annealed samples have a purely in-plane or an out-of-plane magnetic anisotropy, that highlights the reorientation of the magnetization. Moreover, the coercivity of the sample is increased after annealing which can be due to the higher crystallinity of this sample as well as the interface sharpening 18,19. In these multilayers, the sharp interfaces between the magnetic and non-magnetic lattices leads to the hybridization of the magnetic metal’s 3d and non-magnetic metal’s 5d orbitals, which can tune the direction of the magnetic anisotropy depending on the orbital bindings 20,21,22,23. In our sample, this anisotropy axis is more tilted towards the film plane after annealing, which is evidenced by the OP/IP relative saturation fields (Hs) observed from the VSM data. This relative increase is depicted at the inset of Fig. 1(h).
We now turn our focus to magnetic properties of the samples. First, the SW spectroscopy using BLS is used to measure the iDMI strength in both samples. An in-plane bias magnetic field sufficient to saturate the sample is applied to allow the SWs to propagate in the film plane. The iDMI leads to a frequency non-reciprocity of counter-propagating magnetostatic surface SWs (aka Damon-Eshbach mode). Such a frequency non-reciprocity can be observed by the difference between the Stokes (S) and anti-Stokes (AS) frequencies in the BLS spectroscopy 24,25. The same argument applies once the direction of the applied field is inverted. The measured frequency non-reciprocity with respect to the wave vector can be easily characterized, which depends on the DMI constant (D) based on the \(\varDelta\)f =\([2\gamma /{\pi M}_{s}\)] D ksw, where \(\gamma\) is the gyromagnetic ratio and MS is the saturation magnetization 25. It is required to probe surface waves, for which iDMI-induced nonreciprocity becomes maximal and, in particular, linear in k with DMI constant.
The BLS spectra of the SWs having wavenumber of ksw = 20.44 rad/µm in the presence of an applied field of \({\mu }_{0}\)H = ±50 mT (with opposite direction) are shown for the as-deposited and annealed samples in Fig. 2 (a-b) respectively. The BLS spectrum of both field directions shows a SW mode. The annealed sample shows a different SW characteristic. The results from the Lorentzian fits show that the frequency non-reciprocity for this wavenumber is as large as Δf = 490 MHz.
In order to understand the nature of the observed SW mode, we present the measured SW dispersion relation. Figure 2(c-d) shows frequency of the S and AS peaks as a function of the wave vector ksw, at \({\mu }_{0}\)H = ±50 mT for the AS and S modes for the as-deposited and annealed samples respectively. Indeed, the SW dispersion relation is reciprocal, i.e. the AS and S peaks for a given wavenumber have similar frequency for the as-deposited sample. From Fig. 2d, there is frequency difference between counter-propagating SWs for both orientations of the applied magnetic field for the annealed sample.
Figure 2(e) shows the frequency non-reciprocity (∆f) with respect to the wave vector for the as-deposited sample. A vanishing of the frequency difference is observed, indicating that the iDMI is absent in this sample. The sign and the amplitude of the iDMI constant D, have been obtained from the measured frequency non-reciprocity which is presented in Fig. 2(f) for the annealed sample 24,26. The results show a linear variation of the frequency non-reciprocity (∆f) with respect to the wave vector. The slopes obtained from a linear fit of this variation is 0.07881\(\pm\)0.011 GHz/radµm−1. From the slope of the curve, we estimate the value of the D by assuming \(\gamma\) =185 rad/T−1ns−1 27, 28 and MS = 700 kA/m for Py in our samples 29. Therefore, the estimated value of the iDMI constant from BLS measurements is D = 0.47\(\pm\) 0.02 mJ/m2. The obtained iDMI constant is positive (D \(>\) 0), thus, it favors a right-handed chirality 30.
As the structural characterizations show the crystal related evolution by annealing and also the BLS results show the evolution in iDMI, therefore, for a better evaluation on the possible origin of the induced iDMI, computational study were performed for different interface conditions as the following.