Stripe rust, which is caused by Puccinia striiformis f. sp. tritici (Pst), is one of the most devastating airborne diseases of wheat worldwide, affecting more than 80% of cultivated wheat and seriously threatening food security and production (Wellings 2011; Chen et al. 2014; Zeng et al. 2022). Therefore, it is imperative that breeders develop wheat cultivars exhibiting durable resistance to stripe rust. Depending on the growth stages in which certain disease-resistance genes are expressed, stripe rust resistance can be classified as all-stage resistance (ASR) and adult-plant resistance (APR) (Chen 2005). Earlier research indicated ASR is generally a qualitative trait, mostly controlled by a single gene that is easily exploited during breeding, including Yr1, Yr9, Yr15, Yr24, and Yr28 (Murphy et al. 2009; Chen 2020). The mechanism underlying stripe rust resistance is often easily overcome by new pathotypes of the causative phytopathogenic fungus, resulting in decreased resistance or even a complete loss of resistance in many new disease-resistant cultivars after 3–5 years of extensive commercial cultivation (Bariana et al. 2007; Ellis et al. 2014; Chen 2020). In contrast to ASR, APR is mostly a quantitatively inherited trait controlled by multiple genes, with many APR genes conferring race-nonspecific and durable resistance (Gebrewahid et al. 2020). For example, the APR genes Yr18, Yr29, Yr30, and Yr46 are associated with durable stripe rust resistance in several regions worldwide, making them highly valuable and commonly used disease resistance genes (Singh et al. 2005; Spychała et al. 2023). However, the resistance conferred by these genes (except for Yr30) is accompanied by the development of dry leaf tips, which can adversely affect the wheat yield (Spychała et al. 2023). Therefore, it is important to extend the effective-use period of major cultivars, while also rationally exploiting APR genes during the breeding of new cultivars with durable disease resistance.
Wild relatives of wheat possess many valuable genes for improving the disease resistance of wheat (Friebe et al. 1996). For example, diploid (2n = 2x = 14, EE genome), tetraploid (2n = 4x = 28, EEEE genome), and decaploid (2n = 10x = 70, EEEEEEStStStSt genome) Thinopyrum elongatum (Host) D. R. Dewey accessions are important sources of genes related to the resistance to salinity, drought, and disease (Fedak et al. 1999; Li et al. 2004; Fu et al. 2012). After intergeneric hybrids were first generated via the distant hybridization between common wheat and Thinopyrum, many disease resistance genes were identified and wheat–Thinopyrum derivative lines were produced over a period exceeding 40 years (Fedak et al. 1999; Wang et al. 2020). Several genes conferring resistance to various diseases, such as stripe rust (e.g., Yr69) (Hou et al. 2016), stem rust (Sr24, Sr25, Sr26, and Sr43) (Plotnikova et al. 2023; Yu et al. 2023), leaf rust (Lr19, Lr24, and Lr29) (Kloppers et al. 1995; Plotnikova et al. 2023), powdery mildew (Pm51 and PmSn0224) (He et al. 2017), and Fusarium head blight (Fhb7) (Wang et al. 2020), were identified in or cloned from Thinopyrum species. Among these genes, Yr69, Pm51, and PmSn0224 were derived from homologous group 2 of Thinopyrum ponticum (Hou et al. 2016; He et al. 2017); Sr24, Sr25, Sr43, Lr19, Lr24, Lr29, and Fhb7 were derived from homologous groups 3 and 7 of Th. elongatum and Th. ponticum (Kloppers et al. 1995; Plotnikova et al. 2023; Yu et al. 2023); and Sr26 was derived from homoeologous group 6 of Th. ponticum (Plotnikova et al. 2023). It is essential that new resistance genes from other Th. elongatum genotypes are identified and transferred into elite wheat germplasm resources to diversify and enhance wheat disease resistance.
Because of the advances in cytogenetic and molecular techniques applicable for identifying alien chromosomes, various wheat–Thinopyrum lines have been generated through chromosome engineering, including intergeneric amphidiploids (Guo et al. 2015; Hu et al. 2011) as well as addition (Liu et al. 2017; Jia et al. 2022), substitution (Wang et al. 2019), and translocation (Fu et al. 2012; Tanaka et al. 2017; Yang et al. 2022) lines. The partial amphiploid line Xiaoyan 7430 derived from wheat and Th. ponticum is highly resistant to stripe rust (Hu et al. 2011), whereas amphiploid lines 8801, 8802, and 8803 derived from tetraploid Th. elongatum and Triticum durum are highly resistant to stripe rust, powdery mildew, and Fusarium head blight (Guo et al. 2015). Moreover, wheat–Thinopyrum alien chromosome addition and substitution lines are valuable resources for identifying the genes of interest in Th. elongatum and the subsequent use of these genes in wheat breeding programs. A major gene for the stripe rust resistance at the seedling and grain-filling stages was detected on a Th. ponticum group 6 chromosome during the analysis of six wheat–Th. ponticum disomic addition lines derived from the partial amphiploid Xiaoyan 7430 (Jia et al. 2022). We previously developed a wheat–tetraploid Th. elongatum 1E (1D) substitution line resistant to stripe rust, a 3E (3D) substitution line tolerant to salt stress, a 4E (4D) substitution line resistant to stripe rust and powdery mildew, and 6E (6D) substitution lines resistant to stripe rust at the adult stage (Li et al. 2019; Gong et al. 2022; Gong et al. 2023; Zeng et al. 2023). However, the decreased fertility and genetic unpredictability of amphiploid, addition, and substitution lines make them inappropriate for commercial cultivation. Unlike addition and substitution lines, translocation lines are favored by wheat breeders because of their limited amounts of alien genetic material, minor linkage drag, and regular meiotic behavior (Falke et al. 2009). In recent studies, the wheat–Th. ponticum translocation lines WTT34 and WTT80 carrying the T5DS·5DL-Th and TTh-1DS·1DL chromosomes were resistant to Ug99 and Bgt isolates and had excellent agronomic traits (Yang et al. 2021, 2022). Despite these successes, relatively few translocation lines from tetraploid Th. elongatum have been used by breeders to increase wheat disease resistance.
In this study, we developed three novel wheat–tetraploid Th. elongatum translocation lines from the BC1F5 and F4 selfed progeny of the cross between 6E (6D) substitution line K17-1065-4 and common wheat. The chromosome composition of each translocation line was characterized using cytogenetic methods and the wheat 55K SNP array. Their stripe rust resistance and agronomic traits were also evaluated. Moreover, specific simple sequence repeat (SSR) molecular markers were developed for tetraploid Th. elongatum chromosome 6EL. These markers may be applicable for breeding novel wheat lines resistant to disease via the transfer of specific resistance-related genes.