The paper introduces a model of dielectric breakdown strength. The model integrated thermal breakdown and defect models, the relationship between the electric field of ferroelectric films and dimensional parameters and operating temperature (T). The thickness effect is thermal breakdown in origin, whereas the area effect is statistical in nature. This model is verified with experimental results of the lead lanthanum zirconate titanate (PLZT) films of various d (0.8 – 3 m), A (0.0020 – 25 mm2) tested under a range of T (300 – 400 K) with satisfying fitting results. Also learned is a relationship that the recoverable electric energy density is directly proportional to the square of breakdown electric field. This relationship is found viable in predicting the electric energy density in terms of variables of d, A, and T for the PLZT films.